PRODUCTS

Wafer Spacer

Conductive Interleaf
CPS-□-350(Z4)
Conductive film spacer/interleaf/separator

ESD-protected, low-particle, low ion contamination with Achilles’ original material formulation. The corrugated surface design suppresses sticking to wafers and compatible with automated machines.

Features

  • ESD protected
  • Low particle level
  • Low ion contamination
  • Double-side embossing

Specifications

Model number
CPS-□-350(Z4) *□:diameter
Material
Conductive PE
Surface resistance value
R ≦ 1.0×107Ω
Emboss Thickness
350μm

Physical properties

Item measured value
Surface Resistance(23℃, 60%RH) 2.0×106 Ω
Charging potential 0-1 V
Decay time
(1kV→100V)
<0.1 sec
Particle APC(0.5um<) 26 counts/pc
Ion contamination 【anion】(ppb) Cl:ND
NO3:ND
SO4:ND
Ion contamination 【cation】(ppb) Na:ND
K:ND

*This data is an actual measurement value, not a guaranteed value

Surface resistance comparison

Sample Measurement environment
23℃×15%RH 23℃×30%RH 23℃×60%RH 23℃×95%RH
CPS(Z4) 2.0×106 2.1×106 2.0×106 2.1×106

Dust-free paper

(Competitor A)

1.0×1013 3.2×1011 3.8×109 3.4×106

Non-woven fabric

(Competitor B)

1.0××1013< 1.0××1013< 1.0××1013< 1.0××1013<

*This data is an actual measurement value, not a guaranteed value

Triboelectric charging voltage, decay time comparison

Sample Triboelectric charging voltage(V) Decay Time (sec.)
+1kv→+100V -1kv→-100V
CPS(Z4) 0-1 <0.1 <0.1

Dust-free paper

(Competitor A)

2000< 12-100< 10-100<

Non-woven fabric

(Competitor B)

2000< 100< 100<

*This data is an actual measurement value, not a guaranteed value

Ion contamination comparison

Sample Anion Cation
F Cl NO2 Br NO3 SO4 PO4 Li Na NH4 K Mg Ca
CPS(Z4) ND ND ND ND ND ND ND ND ND ND ND ND ND

Dust-free paper

(Competitor A)

ND 540 ND ND 52 830 4 ND 300 ND 970 ND ND

Non-woven fabric

(Competitor B)

ND 2 ND ND 1 ND ND ND ND 1 ND ND ND

*This data is an actual measurement value, not a guaranteed value

Outgassing comparison

Sample Total outgassing[mg] BHT
CPS(Z4) 0.13 ND

Dust-free paper

(Competitor A)

0.005 0.0003

Non-woven fabric

(Competitor B)

0.142 ND

*This data is an actual measurement value, not a guaranteed value

For more information, please feel free to contact us.

Contact Us